HAST/PCT/High Temperature Aging Series

HAST high-voltage accelerated aging chamber is also called highly accelerated life aging test chamber. It is used to evaluate the environmental resistance of electronic components, PCBs, chip products, etc. under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, the acceleration factor is between dozens and hundreds of times. This kind of extreme accelerated simulation reliability test is convenient for determining the extreme working conditions of products or devices, making it easier to discover product failure modes in advance, and shortening the life test time of products or systems, thus gaining time for mass production verification.

PCT high-pressure accelerated aging chamber, also known as saturated steam high-pressure life test chamber, is used to evaluate the environmental resistance of electronic components, PCBs, chip products, etc. under high temperature, high humidity, and high pressure conditions. It accelerates the failure process, shortens the life test time of the product or system, and discovers product failure modes in advance.

Double-layer HAST high-pressure accelerated aging chamber is also called two-slot high-accelerated life aging test chamber. It is used to evaluate the reliability of products or materials in a humidity environment. It is completed by setting and creating various conditions of temperature, humidity, pressure in a highly controlled pressure vessel to evaluate the product's sealing, hygroscopicity and aging performance.