HAST high-voltage accelerated aging test chamber: used to evaluate the environmental resistance of electronic components, PCBs, chip products, etc. under high temperature, high humidity, and high pressure conditions. By accelerating the failure process, the acceleration factor is between dozens and hundreds of times. This type of extreme accelerated simulation reliability test is convenient for determining the extreme working conditions of products or devices, making it easier to discover product failure modes in advance, and shorten the life test time of products or systems, thus gaining time for mass production verification.
Application areas:
Printed circuit boards, semiconductor chips, silicone rubber, ceramics, polymer materials...
Test standards:
AEC Q101
JIS C0096-2
GB/T2423.40-1997 Environmental testing for electrical and electronic products Part 2: Test method Cx: Steady damp heat of unsaturated high-pressure steam
IEC60068-2-66-1994 Environmental testing. Part 2-66: Test method. Test Cx: Steady damp heat
JESD22-A100 Cyclic temperature and humidity offset life
JESD22-A101 Steady temperature, humidity/bias, life test (temperature, humidity, bias life)
JESD22-A102 High pressure cooking test (accelerated moisture penetration resistance)
JESD22-A108 Temperature, bias voltage and working life
JESD22-A110 HAST High Accelerated Temperature and Humidity Stress Test
JESD22-A118 Temperature and Humidity Unbiased High Accelerated Stress Test UHAST (Unbiased Voltage Unsaturated High Pressure Steam)
Product Features:
1.The product integrates high temperature and humidity 85℃/85%R.H, 95℃/95%R.H, CT, and HAST functions.
2. Ultra-long experimental operation time, the equipment can operate continuously for 400+ hours.
3. Equipped with bias terminal (conductive screw M6: voltage 0~380V; maximum withstand voltage 2000V; current 0~100A).
4. Fast exhaust mode, cold air is exhausted before the test; cold air exhaust design during the test (air exhaust in the test barrel) improves pressure stability and reproducibility.
